Q NET Engineering GmbH

3MA
Electromagnetic Microstructure Tester

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Situation

The near-surface residual stress state and the case depth are the most important quality characteristics of case-hardened components. Residual tensile stress in the surface layer caused by faulty heat treatment often leads to failures of these highly stressed parts. Quality control which determines the residual stress of heat-treated parts is partly destructive or in the case of X-ray testing limited to the determination of surface layer residual stress.

3MA 2 - Microstructure tester
Figure 1: 3MA II - Microstructure tester

Solution

The 3MA tester enables process-integrated, non-destructive testing at a considerably high testing speed. The relevant quality parameters can be determined and stored very fast. You obtain information about different parameters of the microstructure and stress conditions at the same time. The 3MA method is mainly used for testing heat-treated parts and treated surfaces.

The overall aim is the non-destructive testing of the following parameters:

Advantages

3MA Testing System

The 3MA device comprises of a computer plus monitor, a control and evaluation unit, a power unit for the magnetisation and an analogue interface for different modules for the determination of different micromagnetic parameters such as:

Barkhausen Noise (BN)

Recording of Barkhausen noise amplitudes versus magnetic field strength (H).
Measurement parameters:

Incremental Permeability

Measuring incremental permeability versus tangential magnetic field strength.
Measurement parameters:

Time Signal of Magnetic Field Strength (Ht (t))

Recording time signal of tangential magnetic field strength.
Measurement parameters:

Multi-Frequency Eddy Current

Measurement parameters:

Example 1

The following example shows the comparison between reference data and the results of non-destructive yield stress testing of tin sheet metal.

Comparison of reference- and test data
Figure 2: Comparison of reference- and test data

Example 2

The following example shows yield stress measurement at moving strip

yield stress measurement
Figure 3: yield stress measurement

Sensor System

The sensor is an electromagnetic transmitter/receiver. The multi-parameter sensor records several micro-magnetic parameters simultaneously. The probe can be adjusted to the customers' individual needs.

3MA sensor
Figure 4: 3MA sensor

Data Collection and Documentation

The use of databases throughout the whole process enables your company to access and organise the planning and testing of data via a connected company network.

Technical Data

Non-destructive testing and data collection of:

Build-up of the 3MA Testing Device

Contact

Yvan Lejeune
Phone: +49 (0) 6 81/9 76 71 53
Fax: +49 (0) 6 81/9 76 71 58